M.2 2280 PCIe SSD HG2283+SanDisk Bics5 TLCSSD 128/256/512GB （OEM/ODM)
It adopts SanDisk Bics5 TLC flash memory chips, offering multiple storage options of 128G/256G/512GB. With excellent read and write performance, it has passed various reliability tests including power cycles, sleep/wake operations, and data preservation. It is resistant to repeated power-on/off cycles and standby/sleep modes, ensuring stable and reliable data read/write operations even under frequent switching and idle conditions. Compatible with desktop and laptop upgrades, it is suitable for daily office work, audio-visual entertainment, creative tasks, etc., providing rapid acceleration for boot-up and software loading.
-------TBW 128GB = 50TB
-------TBW 256GB = 100TB
-------TBW 512GB = 240TB
1. Test Configuration
1.1 Product Information
|
Product Name: |
2280 M.2 HG2283+ SanDisk Bics5 TLC 128GB/256GB/512GB |
|
Flash Part No: |
SanDisk Bics5 TLC |
|
Controller |
HG2283 |
|
Interface |
NVMe PCIe Gen3.0x4 |
|
Dimension |
(L)80 x (W)22 x (T)2.15mm |
|
Form Factor |
2280 M.2 PCIe |
|
Operating |
0°C~70°C |
|
Storage Temp |
-40°C~85°C |
|
Capacity |
128GB/256GB/512GB |
|
Warranty |
3-year |
2. Performance Test
2. 1 CrystalDiskMark
Test Software Versions:V8.0.1
* Test via Windows format (NTFS)
* Total Length = 1GiB
|
Capacity |
Test Item |
Read (MB/ s) |
Write (MB/ s) |
|
128GB |
Sequential 1M Q8T1 |
1610.201 |
999.413 |
|
Sequential 1M Q1T1 |
1609.172 |
996.365 |
|
|
Random 4K Q32T1 |
209.023 |
863.95 |
|
|
Random 4K Q1T1 |
58.807 |
236.946 |
|
|
256GB |
Sequential 1M Q8T1 |
3188.593 |
1894.178 |
|
Sequential 1M Q1T1 |
3191.348 |
1893.871 |
|
|
Random 4K Q32T1 |
408.671 |
1643.944 |
|
|
Random 4K Q1T1 |
58.711 |
225.092 |
|
|
512GB |
Sequential 1M Q8T1 |
3406.827 |
2178.926 |
|
Sequential 1M Q1T1 |
3412.583 |
2176.202 |
|
|
Random 4K Q32T1 |
731.857 |
2017.85 |
|
|
Random 4K Q1T1 |
55.702 |
225.104 |
2.2 AS SSD Benchmark
Test Software Versions:V2.0.7
A) Performance by MB/s
|
Capacity |
Test Item (Test size:1GB) |
Read |
Write |
|
128GB |
Sequential |
1307.19 |
911.71 |
|
4K |
69.18 |
218.24 |
|
|
4K-64Th rd |
247.91 |
833.44 |
|
|
Access Time |
0.018 |
0.024 |
|
|
Score |
448.0 |
1143.0 |
|
|
Total Score |
1829.0 |
||
|
256GB |
Sequential |
2763.14 |
1824.45 |
|
4K |
69.73 |
217.08 |
|
|
4K-64Th rd |
457.79 |
1432.38 |
|
|
Access Time |
0.017 |
0.018 |
|
|
Score |
804.0 |
1832.0 |
|
|
Total Score |
3026.0 |
||
|
512GB |
Sequential |
2994.18 |
2161.17 |
|
4K |
65.08 |
210.27 |
|
|
4K-64Th rd |
713.42 |
1853.52 |
|
|
Access Time |
0.018 |
0.018 |
|
|
Score |
1078.0 |
2280.0 |
|
|
Total Score |
3888.0 |
||
B) Performance by IOPS
|
Capacity |
Test Item (Test size:1GB) |
Read |
Write |
|
128GB |
16MB |
91.38 |
58.26 |
|
4K |
17758.0 |
56429.0 |
|
|
4K-64Th rd |
65462.0 |
204727.0 |
|
|
512B |
54932.0 |
42112.0 |
|
|
Score |
471.0 |
1113.0 |
|
|
Total Score |
1828.0 |
||
|
256GB |
16MB |
176.75 |
114.39 |
|
4K |
17913.0 |
56034.0 |
|
|
4K-64Th rd |
117157.0 |
387372.0 |
|
|
512B |
58168.0 |
55433.0 |
|
|
Score |
810.0 |
1915.0 |
|
|
Total Score |
3116.0 |
||
|
512GB |
16MB |
180.39 |
134.42 |
|
4K |
17044.0 |
56523.0 |
|
|
4K-64Th rd |
186494.0 |
482156.0 |
|
|
512B |
55545.0 |
56887.0 |
|
|
Score |
1084.0 |
2319.0 |
|
|
Total Score |
3941.0 |
||
2.3 IOMeter
Test Software Versions:V1.1.0
|
Capacity |
TEST Item |
IOPS |
|
|
Read |
Write |
||
|
128GB |
4K; Random |
44665.38 |
209528.70 |
|
128K; Sequential |
8380.53 |
7525.21 |
|
|
256GB |
4K; Random |
85101.18 |
393815.65 |
|
128K; Sequential |
14553.59 |
13722.94 |
|
|
512GB |
4K; Random |
138426.75 |
507869.49 |
|
128K; Sequential |
21930.50 |
17060.21 |
|
2.4 HD Tune
Test Software Versions:V610
|
Capacity |
Test Item |
Read (MB/s) |
Write (MB/s) |
|
128GB |
Average |
1725.4 |
1880.5 |
|
256GB |
Average |
1051.2 |
1059.7 |
|
512GB |
Average |
1181.3 |
1214.6 |
2.5 Anvil's Storage Utilities
Test Software Versions:V1.1.0
2.6 ATTO Disk Benchmark
Test Software Versions: V4.01
* Test via Windows format (NTFS)
* Transfer Range: 0.5KB ~ 8192.0KB
* Total Length = 1GiB
3.1 Burn in test + Sleep
S3 Standby + S4 Sleep Hybrid (frequent switching between these two low-power states)
3.2 Power Cycle Test
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